Thermal image analysis for polygraph testing

Ioannis Pavlidis, James A. Levine

Research output: Contribution to journalArticle

118 Citations (Scopus)
Original languageEnglish (US)
Pages (from-to)56-64
Number of pages9
JournalIEEE Engineering in Medicine and Biology Magazine
Volume21
Issue number6
DOIs
StatePublished - Nov 2002

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Truth Disclosure
Lie Detection
Automated Pattern Recognition
Ocular Physiological Phenomena
Image Enhancement
Biological Models
Forensic Medicine
Guilt
Skin Temperature
Blood Flow Velocity
Image enhancement
Deception
Reproducibility of Results
Image analysis
Hot Temperature
Statistics
Sensitivity and Specificity
Testing

ASJC Scopus subject areas

  • Biomedical Engineering
  • Health Informatics
  • Health Information Management

Cite this

Thermal image analysis for polygraph testing. / Pavlidis, Ioannis; Levine, James A.

In: IEEE Engineering in Medicine and Biology Magazine, Vol. 21, No. 6, 11.2002, p. 56-64.

Research output: Contribution to journalArticle

Pavlidis, Ioannis ; Levine, James A. / Thermal image analysis for polygraph testing. In: IEEE Engineering in Medicine and Biology Magazine. 2002 ; Vol. 21, No. 6. pp. 56-64.
@article{42d256ad1d824b18ba4c7be4057ce435,
title = "Thermal image analysis for polygraph testing",
author = "Ioannis Pavlidis and Levine, {James A.}",
year = "2002",
month = "11",
doi = "10.1109/MEMB.2002.1175139",
language = "English (US)",
volume = "21",
pages = "56--64",
journal = "IEEE Pulse",
issn = "2154-2287",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "6",

}

TY - JOUR

T1 - Thermal image analysis for polygraph testing

AU - Pavlidis, Ioannis

AU - Levine, James A.

PY - 2002/11

Y1 - 2002/11

UR - http://www.scopus.com/inward/record.url?scp=0036880526&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0036880526&partnerID=8YFLogxK

U2 - 10.1109/MEMB.2002.1175139

DO - 10.1109/MEMB.2002.1175139

M3 - Article

C2 - 12613212

AN - SCOPUS:0036880526

VL - 21

SP - 56

EP - 64

JO - IEEE Pulse

JF - IEEE Pulse

SN - 2154-2287

IS - 6

ER -