Fingerprint
Dive into the research topics of 'Technical Note: Long-term monitoring of diode sensitivity degradation induced by proton irradiation'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Technical Note: Long-term monitoring of diode sensitivity degradation induced by proton irradiation
James E. Younkin, Daniel G. Robertson, Wei Liu, Yanle Hu, Danairis Hernandez Morales, Martin Bues, Jiajian Shen, Xiaoning Ding
Research output: Contribution to journal › Article › peer-review