Region of interest reconstruction from truncated data in circular cone-beam CT

Lifeng Yu, Yu Zou, Emil Y. Sidky, Charles A. Pelizzari, Peter Munro, Xiaochuan Pan

Research output: Contribution to journalArticlepeer-review

88 Scopus citations

Abstract

The circular scanning trajectory is one of the most widely adopted data-acquisition configurations in computed tomography (CT). The Feldkamp, Davis, Kress (FDK) algorithm and its various modifications have been developed for reconstructing approximately three-dimensional images from circular cone-beam data. When data contain transverse truncations, however, these algorithms may reconstruct images with significant truncation artifacts. It is of practical significance to develop algorithms that can reconstruct region-of-interest (ROI) images from truncated circular cone-beam data that are free of truncation artifacts and that have an accuracy comparable to that obtained from nontruncated cone-beam data. In this work, we have investigated and developed a backprojection-filtration (BPF)-based algorithm for ROI-image reconstruction from circular cone-beam data containing transverse truncations. Furthermore, we have developed a weighted BPF algorithm to exploit "redundant" information in data for improving image quality. In an effort to validate and evaluate the proposed BPF algorithms for circular cone-beam CT, we have performed numerical studies by using both computer-simulation data and experimental data acquired with a radiotherapy cone-beam CT system. Quantitative results in these studies demonstrate that the proposed BPF algorithms for circular cone-beam CT can reconstruct ROI images free of truncation artifacts.

Original languageEnglish (US)
Article number1644803
Pages (from-to)869-881
Number of pages13
JournalIEEE transactions on medical imaging
Volume25
Issue number7
DOIs
StatePublished - Jul 2006

Keywords

  • Computed tomography (CT)
  • Cone-beam CT
  • Image reconstruction
  • Region of interest (ROI)
  • Truncated projection

ASJC Scopus subject areas

  • Software
  • Radiological and Ultrasound Technology
  • Computer Science Applications
  • Electrical and Electronic Engineering

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