Measurement of half-value-layer in X-ray CT: A comparison of two noninvasive techniques

R. L. Kruger, Cynthia H McCollough, F. E. Zink

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Two noninvasive methods of measuring half-value-layer (HVL), the ring and localization techniques, were evaluated and compared with an invasive technique to determine accuracy and reproducibility. Both noninvasive techniques were accurate and reproducible at isocenter. However, the measured HVL was dependent upon the bowtie filter and the location of the ionization chamber with respect to isocenter.

Original languageEnglish (US)
Title of host publicationAnnual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings
EditorsJ.D. Enderle
Pages98-101
Number of pages4
Volume1
StatePublished - 2000
Event22nd Annual International Conference of the IEEE Engineering in Medicine and Biology Society - Chicago, IL, United States
Duration: Jul 23 2000Jul 28 2000

Other

Other22nd Annual International Conference of the IEEE Engineering in Medicine and Biology Society
CountryUnited States
CityChicago, IL
Period7/23/007/28/00

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Ionization chambers
X rays

ASJC Scopus subject areas

  • Bioengineering

Cite this

Kruger, R. L., McCollough, C. H., & Zink, F. E. (2000). Measurement of half-value-layer in X-ray CT: A comparison of two noninvasive techniques. In J. D. Enderle (Ed.), Annual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings (Vol. 1, pp. 98-101)

Measurement of half-value-layer in X-ray CT : A comparison of two noninvasive techniques. / Kruger, R. L.; McCollough, Cynthia H; Zink, F. E.

Annual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings. ed. / J.D. Enderle. Vol. 1 2000. p. 98-101.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Kruger, RL, McCollough, CH & Zink, FE 2000, Measurement of half-value-layer in X-ray CT: A comparison of two noninvasive techniques. in JD Enderle (ed.), Annual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings. vol. 1, pp. 98-101, 22nd Annual International Conference of the IEEE Engineering in Medicine and Biology Society, Chicago, IL, United States, 7/23/00.
Kruger RL, McCollough CH, Zink FE. Measurement of half-value-layer in X-ray CT: A comparison of two noninvasive techniques. In Enderle JD, editor, Annual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings. Vol. 1. 2000. p. 98-101
Kruger, R. L. ; McCollough, Cynthia H ; Zink, F. E. / Measurement of half-value-layer in X-ray CT : A comparison of two noninvasive techniques. Annual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings. editor / J.D. Enderle. Vol. 1 2000. pp. 98-101
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