A rapid link analysis technique using four-port scattering parameters

Bart McCoy, Jonathan Coker, Robert Techentin, Barry Gilbert, Erik Daniel

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

A rapid link analysis technique is presented which simulates link performance using 4-port S-parameter models and pseudo-random driver stimulus. The mathematical technique and validation through simulation and hardware measurements of eye diagrams are presented.

Original languageEnglish (US)
Title of host publicationIEEE 16th Topical Meeting on Electrical Performance of Electronic Packaging, EPEP
Pages307-310
Number of pages4
DOIs
StatePublished - Dec 1 2007
EventIEEE 16th Topical Meeting on Electrical Performance of Electronic Packaging, EPEP - Atlanta, GA, United States
Duration: Oct 29 2007Oct 31 2007

Publication series

NameIEEE Topical Meeting on Electrical Performance of Electronic Packaging

Other

OtherIEEE 16th Topical Meeting on Electrical Performance of Electronic Packaging, EPEP
CountryUnited States
CityAtlanta, GA
Period10/29/0710/31/07

ASJC Scopus subject areas

  • Engineering(all)

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    McCoy, B., Coker, J., Techentin, R., Gilbert, B., & Daniel, E. (2007). A rapid link analysis technique using four-port scattering parameters. In IEEE 16th Topical Meeting on Electrical Performance of Electronic Packaging, EPEP (pp. 307-310). [4387188] (IEEE Topical Meeting on Electrical Performance of Electronic Packaging). https://doi.org/10.1109/EPEP.2007.4387188