A rapid link analysis technique using four-port scattering parameters

Bart McCoy; Jonathan Coker; Robert Techentin; Barry Gilbert; Erik Daniel

doi:10.1109/EPEP.2007.4387188

A rapid link analysis technique using four-port scattering parameters

Bart McCoy, Jonathan Coker, Robert Techentin, Barry Gilbert, Erik Daniel

Physiology & Biomedical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Scopus citations

Abstract

A rapid link analysis technique is presented which simulates link performance using 4-port S-parameter models and pseudo-random driver stimulus. The mathematical technique and validation through simulation and hardware measurements of eye diagrams are presented.

Original language	English (US)
Title of host publication	IEEE 16th Topical Meeting on Electrical Performance of Electronic Packaging, EPEP
Pages	307-310
Number of pages	4
DOIs	https://doi.org/10.1109/EPEP.2007.4387188
State	Published - 2007
Event	IEEE 16th Topical Meeting on Electrical Performance of Electronic Packaging, EPEP - Atlanta, GA, United States Duration: Oct 29 2007 → Oct 31 2007

Publication series

Name	IEEE Topical Meeting on Electrical Performance of Electronic Packaging

Other

Other	IEEE 16th Topical Meeting on Electrical Performance of Electronic Packaging, EPEP
Country/Territory	United States
City	Atlanta, GA
Period	10/29/07 → 10/31/07

ASJC Scopus subject areas

General Engineering

Access to Document

10.1109/EPEP.2007.4387188

Cite this

McCoy, B., Coker, J., Techentin, R., Gilbert, B., & Daniel, E. (2007). A rapid link analysis technique using four-port scattering parameters. In IEEE 16th Topical Meeting on Electrical Performance of Electronic Packaging, EPEP (pp. 307-310). Article 4387188 (IEEE Topical Meeting on Electrical Performance of Electronic Packaging). https://doi.org/10.1109/EPEP.2007.4387188

A rapid link analysis technique using four-port scattering parameters. / McCoy, Bart; Coker, Jonathan; Techentin, Robert et al.
IEEE 16th Topical Meeting on Electrical Performance of Electronic Packaging, EPEP. 2007. p. 307-310 4387188 (IEEE Topical Meeting on Electrical Performance of Electronic Packaging).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

McCoy, B, Coker, J, Techentin, R, Gilbert, B & Daniel, E 2007, A rapid link analysis technique using four-port scattering parameters. in IEEE 16th Topical Meeting on Electrical Performance of Electronic Packaging, EPEP., 4387188, IEEE Topical Meeting on Electrical Performance of Electronic Packaging, pp. 307-310, IEEE 16th Topical Meeting on Electrical Performance of Electronic Packaging, EPEP, Atlanta, GA, United States, 10/29/07. https://doi.org/10.1109/EPEP.2007.4387188

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title = "A rapid link analysis technique using four-port scattering parameters",

abstract = "A rapid link analysis technique is presented which simulates link performance using 4-port S-parameter models and pseudo-random driver stimulus. The mathematical technique and validation through simulation and hardware measurements of eye diagrams are presented.",

author = "Bart McCoy and Jonathan Coker and Robert Techentin and Barry Gilbert and Erik Daniel",

year = "2007",

doi = "10.1109/EPEP.2007.4387188",

language = "English (US)",

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note = "IEEE 16th Topical Meeting on Electrical Performance of Electronic Packaging, EPEP ; Conference date: 29-10-2007 Through 31-10-2007",

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Y2 - 29 October 2007 through 31 October 2007

ER -

A rapid link analysis technique using four-port scattering parameters

Abstract

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ASJC Scopus subject areas

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