A rapid link analysis technique using four-port scattering parameters

Bart McCoy, Jonathan Coker, Robert Techentin, Barry Kent Gilbert, Erik Daniel

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

A rapid link analysis technique is presented which simulates link performance using 4-port S-parameter models and pseudo-random driver stimulus. The mathematical technique and validation through simulation and hardware measurements of eye diagrams are presented.

Original languageEnglish (US)
Title of host publicationIEEE Topical Meeting on Electrical Performance of Electronic Packaging
Pages307-310
Number of pages4
DOIs
StatePublished - 2007
EventIEEE 16th Topical Meeting on Electrical Performance of Electronic Packaging, EPEP - Atlanta, GA, United States
Duration: Oct 29 2007Oct 31 2007

Other

OtherIEEE 16th Topical Meeting on Electrical Performance of Electronic Packaging, EPEP
CountryUnited States
CityAtlanta, GA
Period10/29/0710/31/07

Fingerprint

Scattering parameters
Hardware

ASJC Scopus subject areas

  • Engineering(all)

Cite this

McCoy, B., Coker, J., Techentin, R., Gilbert, B. K., & Daniel, E. (2007). A rapid link analysis technique using four-port scattering parameters. In IEEE Topical Meeting on Electrical Performance of Electronic Packaging (pp. 307-310). [4387188] https://doi.org/10.1109/EPEP.2007.4387188

A rapid link analysis technique using four-port scattering parameters. / McCoy, Bart; Coker, Jonathan; Techentin, Robert; Gilbert, Barry Kent; Daniel, Erik.

IEEE Topical Meeting on Electrical Performance of Electronic Packaging. 2007. p. 307-310 4387188.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

McCoy, B, Coker, J, Techentin, R, Gilbert, BK & Daniel, E 2007, A rapid link analysis technique using four-port scattering parameters. in IEEE Topical Meeting on Electrical Performance of Electronic Packaging., 4387188, pp. 307-310, IEEE 16th Topical Meeting on Electrical Performance of Electronic Packaging, EPEP, Atlanta, GA, United States, 10/29/07. https://doi.org/10.1109/EPEP.2007.4387188
McCoy B, Coker J, Techentin R, Gilbert BK, Daniel E. A rapid link analysis technique using four-port scattering parameters. In IEEE Topical Meeting on Electrical Performance of Electronic Packaging. 2007. p. 307-310. 4387188 https://doi.org/10.1109/EPEP.2007.4387188
McCoy, Bart ; Coker, Jonathan ; Techentin, Robert ; Gilbert, Barry Kent ; Daniel, Erik. / A rapid link analysis technique using four-port scattering parameters. IEEE Topical Meeting on Electrical Performance of Electronic Packaging. 2007. pp. 307-310
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