A new macromodeling approach for digital output drivers and application in simultaneous switching noise analysis

Benjamin R. Buhrow, Erik S. Daniel, Barry K. Gilbert

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Output driver models play a critical role in simultaneous switching noise (SSN) analysis. However, their accuracy must often be compromised with simplicity of implementation for large scale SSN simulations. We present an approach for creating simple, fast, and accurate macromodels of output drivers. To demonstrate their usefulness, simulation results in multi-IO SSN simulations are shown and compared to those obtained from transistor level SPICE libraries.

Original languageEnglish (US)
Title of host publicationIEEE 16th Topical Meeting on Electrical Performance of Electronic Packaging, EPEP
Pages255-258
Number of pages4
DOIs
StatePublished - Dec 1 2007
EventIEEE 16th Topical Meeting on Electrical Performance of Electronic Packaging, EPEP - Atlanta, GA, United States
Duration: Oct 29 2007Oct 31 2007

Publication series

NameIEEE Topical Meeting on Electrical Performance of Electronic Packaging

Other

OtherIEEE 16th Topical Meeting on Electrical Performance of Electronic Packaging, EPEP
CountryUnited States
CityAtlanta, GA
Period10/29/0710/31/07

ASJC Scopus subject areas

  • Engineering(all)

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    Buhrow, B. R., Daniel, E. S., & Gilbert, B. K. (2007). A new macromodeling approach for digital output drivers and application in simultaneous switching noise analysis. In IEEE 16th Topical Meeting on Electrical Performance of Electronic Packaging, EPEP (pp. 255-258). [4387175] (IEEE Topical Meeting on Electrical Performance of Electronic Packaging). https://doi.org/10.1109/EPEP.2007.4387175