TY - GEN
T1 - A new macromodeling approach for digital output drivers and application in simultaneous switching noise analysis
AU - Buhrow, Benjamin R.
AU - Daniel, Erik S.
AU - Gilbert, Barry K.
PY - 2007
Y1 - 2007
N2 - Output driver models play a critical role in simultaneous switching noise (SSN) analysis. However, their accuracy must often be compromised with simplicity of implementation for large scale SSN simulations. We present an approach for creating simple, fast, and accurate macromodels of output drivers. To demonstrate their usefulness, simulation results in multi-IO SSN simulations are shown and compared to those obtained from transistor level SPICE libraries.
AB - Output driver models play a critical role in simultaneous switching noise (SSN) analysis. However, their accuracy must often be compromised with simplicity of implementation for large scale SSN simulations. We present an approach for creating simple, fast, and accurate macromodels of output drivers. To demonstrate their usefulness, simulation results in multi-IO SSN simulations are shown and compared to those obtained from transistor level SPICE libraries.
UR - http://www.scopus.com/inward/record.url?scp=47949123002&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=47949123002&partnerID=8YFLogxK
U2 - 10.1109/EPEP.2007.4387175
DO - 10.1109/EPEP.2007.4387175
M3 - Conference contribution
AN - SCOPUS:47949123002
SN - 1424408830
SN - 9781424408832
T3 - IEEE Topical Meeting on Electrical Performance of Electronic Packaging
SP - 255
EP - 258
BT - IEEE 16th Topical Meeting on Electrical Performance of Electronic Packaging, EPEP
T2 - IEEE 16th Topical Meeting on Electrical Performance of Electronic Packaging, EPEP
Y2 - 29 October 2007 through 31 October 2007
ER -