The authors discuss various GaAs transistor and gate technologies that have evolved since 1980, the strengths and deficiencies of each, and the probable uses of both the first and second generations of digital GaAs in a complex target signal processor, the AOSP. They also discuss the testing of GaAs components at the wafer probe, packaged part, and assembled circuit board levels, since the device speeds exceed the chip test capabilities of commercially available testers.
|Original language||English (US)|
|State||Published - Dec 1 1986|
ASJC Scopus subject areas
- Electrical and Electronic Engineering