Study of sidelobe reduction for limited diffraction beams

Jian yu Lu, James F. Greenleaf

Research output: Chapter in Book/Report/Conference proceedingConference contribution

9 Scopus citations

Abstract

Limited diffraction beams have a large depth of field and are approximately depth-independent, even if they are produced with a finite aperture. Therefore, they may have applications in medical imaging, tissue characterization, nondestructive evaluation of materials, as well as other physical branches such as optics and electromagnetics. However, limited diffraction beams have larger sidelobes than those of conventional beams at their focuses. A method has been proposed for reducing the sidelobes of limited diffraction beams at the expense of frame rate. In this paper, we study the efficacy of the method when stepwise aperture weighting functions are used to produce the beams. Results show that the method works well with a transducer of only 14 rings and 16 sectors. The transducer has a 25 mm diameter and 3.5 MHz central frequency, and can produce a pulse-echo response that maintains a -6-dB mainlobe width of about 1.83 mm over a depth of field of about 150 mm.

Original languageEnglish (US)
Title of host publicationProceedings of the IEEE Ultrasonics Symposium
PublisherPubl by IEEE
Pages1077-1082
Number of pages6
ISBN (Print)0780312783
StatePublished - Dec 1 1993
EventProceedings of the IEEE 1993 Ultrasonics Symposium - Baltimore, MD, USA
Duration: Oct 31 1993Nov 3 1993

Publication series

NameProceedings of the IEEE Ultrasonics Symposium
Volume2
ISSN (Print)1051-0117

Other

OtherProceedings of the IEEE 1993 Ultrasonics Symposium
CityBaltimore, MD, USA
Period10/31/9311/3/93

ASJC Scopus subject areas

  • Acoustics and Ultrasonics

Fingerprint Dive into the research topics of 'Study of sidelobe reduction for limited diffraction beams'. Together they form a unique fingerprint.

  • Cite this

    Lu, J. Y., & Greenleaf, J. F. (1993). Study of sidelobe reduction for limited diffraction beams. In Proceedings of the IEEE Ultrasonics Symposium (pp. 1077-1082). (Proceedings of the IEEE Ultrasonics Symposium; Vol. 2). Publ by IEEE.