@article{d404342af756446e889b14168cb6f46b,
title = "Single event effects in circuit-hardened SiGe HBT logic at gigabit per second data rates",
abstract = "This attempt at circuit level single event effects (SEE) hardening of SiGe HBT logic provides the first reported indication of the level of sensitivity in this important technology. Characterization over data rate up to 3 Gbps and over a broad range of heavy ion LET's provides important clues to upset mechanisms and implications for upset rate predictions. We augment ion test data with pulsed laser SEE testing to indicate the sensitive targets within the circuit and to provide insights into the upset mechanism(s).",
author = "Marshall, {Paul W.} and Carts, {Martin A.} and Arthur Campbell and Dale McMorrow and Steve Buchner and Ryan Stewart and Barbara Randall and Barry Gilbert and Reed, {Robert A.}",
note = "Funding Information: Manuscript received July 24, 2000. This work was supported in part by DTRA. P. W. Marshall and S. Buchner are with SFA, Inc. in support of the Naval Research Laboratory, Washington, DC 20375 USA (e-mail: pwmar-shall@aol.com). M. A. Carts was with SFA, Inc. in support of the Naval Research Laboratory. He is now with Raytheon Systems Corporation, Lanham, MD 20706 USA. A. Campbell and D. McMorrow are with the Naval Research Laboratory, Washington, DC 20375 USA. R. Stewart was with The Mayo Foundation, Rochester, MN 55905 USA. He is now with the University of Texas, Southwestern School of Medicine. B. Randall and B. Gilbert are with The Mayo Foundation, Rochester, MN 55905 USA. R. A. Reed is with NASA Goddard Space Flight Center, Greenbelt, MD 20771 USA. Publisher Item Identifier S 0018-9499(00)11164-5.; 2000 IEEE Nuclear and Space Radiation Effects Conference (NSREC) ; Conference date: 24-07-2000 Through 28-07-2000",
year = "2000",
month = dec,
doi = "10.1109/23.903824",
language = "English (US)",
volume = "47",
pages = "2669--2674",
journal = "IEEE Transactions on Nuclear Science",
issn = "0018-9499",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "6 III",
}