SEU error signature analysis of Gbit/s SiGe logic circuits using a pulsed laser microprobe

Akil K. Sutton, Ramkumar Krithivasan, Paul W. Marshall, Martin A. Carts, Christina Seidleck, Ray Ladbury, John D. Cressler, Cheryl J. Marshall, Steve Currie, Robert A. Reed, Guofu Niu, Barbara Randall, Karl Fritz, Dale McMorrow, Barry Gilbert

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