SEU error signature analysis of Gbit/s SiGe logic circuits using a pulsed laser microprobe

Akil K. Sutton, Ramkumar Krithivasan, Paul W. Marshall, Martin A. Carts, Christina Seidleck, Ray Ladbury, John D. Cressler, Cheryl J. Marshall, Steve Currie, Robert A. Reed, Guofu Niu, Barbara Randall, Karl Fritz, Dale McMorrow, Barry Kent Gilbert

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

We present, for the first time, an analysis of the error signatures captured during pulsed laser microprobe testing of high-speed digital SiGe logic circuits. 127-bit shift registers, configured using various circuit level latch hardening schemes and incorporated into the circuit for radiation effects self test serve as the primary test vehicle. Our results indicate significant variations in the observed upset rate as a function of strike location and latch architecture. Error information gathered on the sensitive transistor nodes within the latches and characteristic upset durations agree well with recently reported heavy-ion microprobe data. These results support the growing credibility in using pulsed laser testing as a lower-cost alternative to heavy-ion microprobe analysis of sensitive device and circuit nodes, as well as demonstrate the efficiency of the autonomous detection and error approach for high speed bit-error rate testing. Implications for SEU hardening in SiGe are addressed and circuit-level and device-level Radiation Hardening By Design recommendations are made.

Original languageEnglish (US)
Pages (from-to)3277-3284
Number of pages8
JournalIEEE Transactions on Nuclear Science
Volume53
Issue number6
DOIs
StatePublished - Dec 2006
Externally publishedYes

Fingerprint

signature analysis
logic circuits
Logic circuits
latches
Pulsed lasers
pulsed lasers
Networks (circuits)
Heavy ions
hardening
Hardening
heavy ions
Testing
radiation hardening
Radiation hardening
high speed
self tests
shift registers
test vehicles
Shift registers
Flip flop circuits

Keywords

  • Built-in self-test
  • Circuit level hardening
  • High-speed bit-error rate testing
  • Pulsed laser testing
  • Silicon-germanium (SiGe)
  • Single-event effects (SEU)

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Nuclear Energy and Engineering

Cite this

SEU error signature analysis of Gbit/s SiGe logic circuits using a pulsed laser microprobe. / Sutton, Akil K.; Krithivasan, Ramkumar; Marshall, Paul W.; Carts, Martin A.; Seidleck, Christina; Ladbury, Ray; Cressler, John D.; Marshall, Cheryl J.; Currie, Steve; Reed, Robert A.; Niu, Guofu; Randall, Barbara; Fritz, Karl; McMorrow, Dale; Gilbert, Barry Kent.

In: IEEE Transactions on Nuclear Science, Vol. 53, No. 6, 12.2006, p. 3277-3284.

Research output: Contribution to journalArticle

Sutton, AK, Krithivasan, R, Marshall, PW, Carts, MA, Seidleck, C, Ladbury, R, Cressler, JD, Marshall, CJ, Currie, S, Reed, RA, Niu, G, Randall, B, Fritz, K, McMorrow, D & Gilbert, BK 2006, 'SEU error signature analysis of Gbit/s SiGe logic circuits using a pulsed laser microprobe', IEEE Transactions on Nuclear Science, vol. 53, no. 6, pp. 3277-3284. https://doi.org/10.1109/TNS.2006.886232
Sutton, Akil K. ; Krithivasan, Ramkumar ; Marshall, Paul W. ; Carts, Martin A. ; Seidleck, Christina ; Ladbury, Ray ; Cressler, John D. ; Marshall, Cheryl J. ; Currie, Steve ; Reed, Robert A. ; Niu, Guofu ; Randall, Barbara ; Fritz, Karl ; McMorrow, Dale ; Gilbert, Barry Kent. / SEU error signature analysis of Gbit/s SiGe logic circuits using a pulsed laser microprobe. In: IEEE Transactions on Nuclear Science. 2006 ; Vol. 53, No. 6. pp. 3277-3284.
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