Pattern analysis using Zernike moments

E. M. Arvacheh, H. R. Tizhoosh

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Complex Zernike moments derive independent spatial information from an image due to the orthogonality of the Zernike polynomials. The orthogonality, rotation invariance and spatial feature representation of the Zernike moments have been the main motivations to study their characteristics. Statistical variability of iris patterns has encouraged us to apply Zernike moments to a database, of iris images in order to evaluate their feature representation performance. The features are in complex form and represented by phase and magnitude information. In this experiment, characteristics of the magnitude information have been studied and the results of 250 comparisons among 50 different eye images are presented as well.

Original languageEnglish (US)
Title of host publicationIMTC'05 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference
Pages1574-1578
Number of pages5
DOIs
StatePublished - 2005
EventIMTC'05 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference - Ottawa, ON, Canada
Duration: May 16 2005May 19 2005

Publication series

NameConference Record - IEEE Instrumentation and Measurement Technology Conference
Volume2
ISSN (Print)1091-5281

Conference

ConferenceIMTC'05 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference
Country/TerritoryCanada
CityOttawa, ON
Period5/16/055/19/05

Keywords

  • Normalization
  • Orthogonality
  • Pattern recognition
  • Rotation invariance
  • Spatial information
  • Zernike moments

ASJC Scopus subject areas

  • Instrumentation

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