Non-TMR SEU-hardening techniques for SiGe HBT shift registers and clock buffers

Edward P. Wilcox; Stanley D. Phillips; John D. Cressler; Paul W. Marshall; Martin A. Carts; Jonathan A. Pellish; Larry Richmond; William Mathes; Barbara Randall; Devon Post; Barry Gilbert; Erik Daniel

doi:10.1109/TNS.2010.2051681

Non-TMR SEU-hardening techniques for SiGe HBT shift registers and clock buffers

Edward P. Wilcox, Stanley D. Phillips, John D. Cressler, Paul W. Marshall, Martin A. Carts, Jonathan A. Pellish, Larry Richmond, William Mathes, Barbara Randall, Devon Post, Barry Gilbert, Erik Daniel

Physiology & Biomedical Engineering

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

We report new results from both broad-beam, heavy-ion and proton experiments for circuit-level RHBD techniques in SiGe digital logic. Redundant circuit elements within the latches are used to significantly reduce single-event upset rates in shift registers and clock paths, without resorting to TMR techniques.

Original language	English (US)
Article number	5550386
Pages (from-to)	2119-2123
Number of pages	5
Journal	IEEE Transactions on Nuclear Science
Volume	57
Issue number	4 PART 1
DOIs	https://doi.org/10.1109/TNS.2010.2051681
State	Published - Aug 2010

Keywords

Bit-error rate testing
gated feedback cell (GFC)
radiation hardening by design (RHBD)
silicon-germanium (SiGe)
single event upset (SEU)

ASJC Scopus subject areas

Nuclear and High Energy Physics
Nuclear Energy and Engineering
Electrical and Electronic Engineering

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10.1109/TNS.2010.2051681

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Wilcox, E. P., Phillips, S. D., Cressler, J. D., Marshall, P. W., Carts, M. A., Pellish, J. A., Richmond, L., Mathes, W., Randall, B., Post, D., Gilbert, B., & Daniel, E. (2010). Non-TMR SEU-hardening techniques for SiGe HBT shift registers and clock buffers. IEEE Transactions on Nuclear Science, 57(4 PART 1), 2119-2123. Article 5550386. https://doi.org/10.1109/TNS.2010.2051681

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AU - Carts, Martin A.

AU - Pellish, Jonathan A.

AU - Richmond, Larry

AU - Mathes, William

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AU - Post, Devon

AU - Gilbert, Barry

AU - Daniel, Erik

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KW - Bit-error rate testing

KW - gated feedback cell (GFC)

KW - radiation hardening by design (RHBD)

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Non-TMR SEU-hardening techniques for SiGe HBT shift registers and clock buffers

Abstract

Keywords

ASJC Scopus subject areas

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