Network Model Compensation For Single-Point Measurements Of Multi-Pin Devices When Using Non-Invasive Current Estimation

Chad M. Smutzer, Jordan R. Keuseman, Clifton R. Haider, Barry Kent Gilbert

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Power delivery network (PDN) model development is often simplified using superports or pin-groups for high pin count devices. This approach significantly reduces model complexity but can compromise accuracy in holistic time- and frequency-domain analyses. In the context of the non-invasive current estimation (NICE) technique for packaged, high-performance integrated circuits (ICs), this paper describes the limitations of using pin-group PDN models in distributed impedance applications. DC error calibration factors are calculated, and tuned AC error compensation networks are proposed. These fundamental techniques for working with overly simplified models in highly distributed power integrity applications are derived and demonstrated through simulation and measurement on exemplar hardware.

Original languageEnglish (US)
Title of host publicationEPEPS 2022 - IEEE 31st Conference on Electrical Performance of Electronic Packaging and Systems
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781665450751
DOIs
StatePublished - 2022
Event31st IEEE Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2022 - San Jose, United States
Duration: Oct 9 2022Oct 12 2022

Publication series

NameEPEPS 2022 - IEEE 31st Conference on Electrical Performance of Electronic Packaging and Systems

Conference

Conference31st IEEE Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2022
Country/TerritoryUnited States
CitySan Jose
Period10/9/2210/12/22

Keywords

  • Distributed Network Compensation
  • Load Current Calculation
  • PDN Modeling
  • Power Delivery

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality
  • Electronic, Optical and Magnetic Materials
  • Instrumentation

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