Multispectral analysis and visualization of multiple sclerosis lesions in MR volumes of the brain

J. R. Mitchell, Stephen J. Karlik, Donald Lee, Aaron Fenster

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

MRI is a valuable tool in the diagnosis of multiple sclerosis (MS). Standard MR protocols for imaging MS produce proton density (PD) and T2 weighted images of the same slice in the brain. While these image pairs provide valuable information about MS lesions, they are two dimensional (2-D) while lesions are three dimensional (3-D). Furthermore, the vast amount of data produced in an MR exam for MS makes routine analysis and comparison of the image pairs difficult. Therefore, we have developed a computerized system which employs multi-spectral analysis techniques to allow interactive 3-D analysis of MR data by radiologists and neurologists. We have used our system to classify and analyze four MR exams of a chronic-progressive MS patient taken over an 18 month period. Comparison of volume renderings of classified white matter, grey matter and MS lesions at each exam date provide information about the changes in individual lesions, and total lesion burden. Analysis of the intensity distributions of large MS lesions reveals that they have a wide range of PD/T2 weighted intensities, and some contain a higher PD/longer T2 'core' perhaps corresponding to edema.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsMurray H. Loew
PublisherPubl by Society of Photo-Optical Instrumentation Engineers
Pages442-452
Number of pages11
ISBN (Print)0819411310
StatePublished - 1993
EventMedical Imaging 1993: Image Processing - Newport Beach, CA, USA
Duration: Feb 14 1992Feb 19 1992

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume1898
ISSN (Print)0277-786X

Other

OtherMedical Imaging 1993: Image Processing
CityNewport Beach, CA, USA
Period2/14/922/19/92

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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