Modeling Metal Surface Roughness with a Single Parameter

Michael J. Degerstrom, Christopher K. White, Barry K. Gilbert, Clifton R. Haider

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Conductor surface roughness loss models typically use two physical parameters to vary losses. A similar model was developed that required a single parameter so that the model could alternatively be defined to have a specific loss attributed to surface roughness.

Original languageEnglish (US)
Title of host publicationEPEPS 2018 - IEEE 27th Conference on Electrical Performance of Electronic Packaging and Systems
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages249-251
Number of pages3
ISBN (Electronic)9781538693032
DOIs
StatePublished - Nov 13 2018
Event27th IEEE Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2018 - San Jose, United States
Duration: Oct 14 2018Oct 17 2018

Publication series

NameEPEPS 2018 - IEEE 27th Conference on Electrical Performance of Electronic Packaging and Systems

Other

Other27th IEEE Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2018
Country/TerritoryUnited States
CitySan Jose
Period10/14/1810/17/18

Keywords

  • Hexagonal close-packed spheres
  • Surface roughness
  • Transmission line

ASJC Scopus subject areas

  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality
  • Electronic, Optical and Magnetic Materials

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