High temperature resistance of small diameter, metallic single-walled carbon nanotube devices

Alexander A. Kane, Kevin Loutherback, Brett R. Goldsmith, Philip G. Collins

Research output: Contribution to journalArticlepeer-review

10 Scopus citations

Abstract

The effects of high temperature cycling on the resistance of metallic single-walled carbon nanotube (SWCNT) devices is measured in situ. Individual, small-diameter SWCNTs contacted by palladium or titanium electrodes were measured from room temperature up to 1000 K in ultrahigh vacuum. Upon the first thermal cycling, the device resistances fluctuate and generally decrease. Pd-contacted devices typically become stable by 450 K, whereas Ti-contacted devices require higher treatments above 600 K. Once these temperatures have been exceeded, subsequent thermal cycling has minimal effects. Heat-treated devices exhibit linear temperature dependences, with Pd and Ti contacts producing average temperature coefficients of -3× 10-4 K and 1.1× 10-3 K, respectively.

Original languageEnglish (US)
Article number083506
JournalApplied Physics Letters
Volume92
Issue number8
DOIs
StatePublished - 2008

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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