High frequency dielectric properties of thin-film pzt capacitors

W. Williamson, Barry Kent Gilbert, H. D. Chen, K. R. Udayakumar, L. E. Cross, C. M. Bozler

Research output: Contribution to journalArticle

11 Scopus citations

Abstract

We present a method for calculating the dielectric constant and the dissipation factor for thin-film ferroelectric capacitors from scattering parameter measurements at multi-gigahertz frequencies. Physical measurement is discussed along with description of the model upon which the calculation is based. Experimental results for 0.5 micron films of PZT are reported up to 15 GHz. Direct measurement is compared with indirectly calculated values at the 100 MHz to 1.5 GHz range, showing excellent agreement.

Original languageEnglish (US)
Pages (from-to)335-342
Number of pages8
JournalIntegrated Ferroelectrics
Volume10
Issue number1-4
DOIs
StatePublished - 1995

    Fingerprint

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Ceramics and Composites
  • Materials Chemistry
  • Electronic, Optical and Magnetic Materials

Cite this

Williamson, W., Gilbert, B. K., Chen, H. D., Udayakumar, K. R., Cross, L. E., & Bozler, C. M. (1995). High frequency dielectric properties of thin-film pzt capacitors. Integrated Ferroelectrics, 10(1-4), 335-342. https://doi.org/10.1080/10584589508012291