High frequency dielectric properties of PLZT thin films

William Williamson, H. Daniel Chen, L. Eric Cross, Barry Kent Gilbert

Research output: Chapter in Book/Report/Conference proceedingChapter

3 Citations (Scopus)

Abstract

The dielectric constant and loss tangent of a variety of compounds of sol-gel PLZT have been studied at frequencies of up to 50 GHz The method of investigation involves measuring microwave striplines with small parallel plate capacitors shunted to ground. Measured S-parameters are used to calculate dielectric properties. The data shows no significant dielectric dispersion mechanism in the 1-50 GHz range. It does appear that a moderate loss in dielectric constant is due to domain wall effects.

Original languageEnglish (US)
Title of host publicationIntegrated Ferroelectrics
Pages197-203
Number of pages7
Volume17
Edition1-4
StatePublished - 1997

Fingerprint

Dielectric properties
dielectric properties
Permittivity
permittivity
Thin films
thin films
parallel plates
tangents
dielectric loss
domain wall
Strip telecommunication lines
capacitors
Domain walls
Scattering parameters
gels
Dielectric losses
microwaves
Sol-gels
Capacitors
Microwaves

Keywords

  • Decoupling capacitors
  • Dielectric properties
  • Microwave frequency
  • PLZT

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Physics and Astronomy (miscellaneous)
  • Condensed Matter Physics

Cite this

Williamson, W., Chen, H. D., Cross, L. E., & Gilbert, B. K. (1997). High frequency dielectric properties of PLZT thin films. In Integrated Ferroelectrics (1-4 ed., Vol. 17, pp. 197-203)

High frequency dielectric properties of PLZT thin films. / Williamson, William; Chen, H. Daniel; Cross, L. Eric; Gilbert, Barry Kent.

Integrated Ferroelectrics. Vol. 17 1-4. ed. 1997. p. 197-203.

Research output: Chapter in Book/Report/Conference proceedingChapter

Williamson, W, Chen, HD, Cross, LE & Gilbert, BK 1997, High frequency dielectric properties of PLZT thin films. in Integrated Ferroelectrics. 1-4 edn, vol. 17, pp. 197-203.
Williamson W, Chen HD, Cross LE, Gilbert BK. High frequency dielectric properties of PLZT thin films. In Integrated Ferroelectrics. 1-4 ed. Vol. 17. 1997. p. 197-203
Williamson, William ; Chen, H. Daniel ; Cross, L. Eric ; Gilbert, Barry Kent. / High frequency dielectric properties of PLZT thin films. Integrated Ferroelectrics. Vol. 17 1-4. ed. 1997. pp. 197-203
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