High frequency dielectric properties of PLZT thin films

William Williamson, H. Daniel Chen, L. Eric Cross, Barry K. Gilbert

Research output: Contribution to journalArticle

3 Scopus citations

Abstract

The dielectric constant and loss tangent of a variety of compounds of sol-gel PLZT have been studied at frequencies of up to 50 GHz The method of investigation involves measuring microwave striplines with small parallel plate capacitors shunted to ground. Measured S-parameters are used to calculate dielectric properties. The data shows no significant dielectric dispersion mechanism in the 1-50 GHz range. It does appear that a moderate loss in dielectric constant is due to domain wall effects.

Original languageEnglish (US)
Pages (from-to)197-203
Number of pages7
JournalIntegrated Ferroelectrics
Volume17
Issue number1-4
DOIs
StatePublished - Jan 1 1997

Keywords

  • Decoupling capacitors
  • Dielectric properties
  • Microwave frequency
  • PLZT

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Control and Systems Engineering
  • Ceramics and Composites
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry

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