High-frequency characterization of power/ground-plane structures

Guang Tsai Lei, Robert W. Techentin, Barry Kent Gilbert

Research output: Contribution to journalArticle

278 Citations (Scopus)

Abstract

In this paper, we describe a strategy to characterize power and ground-plane structures using a full cavity-mode frequency-domain resonator model. We develop insights into modal analysis and introduce a novel technique to suppress modal impedances, minimizing both transfer and input impedances. The influence of port locations on the Z matrix is evaluated.

Original languageEnglish (US)
Pages (from-to)562-569
Number of pages8
JournalIEEE Transactions on Microwave Theory and Techniques
Volume47
Issue number5
DOIs
StatePublished - 1999

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Modal analysis
Resonators
impedance
resonators
cavities
matrices

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

High-frequency characterization of power/ground-plane structures. / Lei, Guang Tsai; Techentin, Robert W.; Gilbert, Barry Kent.

In: IEEE Transactions on Microwave Theory and Techniques, Vol. 47, No. 5, 1999, p. 562-569.

Research output: Contribution to journalArticle

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