Heavy-Ion Broad-Beam and Microprobe Studies of Single-Event Upsets in 0.20-μm SiGe Heterojunction Bipolar Transistors and Circuits

Robert A. Reed, Paul W. Marshall, James C. Pickel, Martin A. Carts, Bryan Fodness, Guofu Niu, Karl Fritz, Gyorgy Vizkelethy, Paul E. Dodd, Tim Irwin, John D. Cressler, Ramkumar Krithivasan, Pamela Riggs, Jason Prairie, Barbara Randall, Barry Gilbert, Kenneth A. LaBel

Research output: Contribution to journal › Article › peer-review

56 Scopus citations

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