Fully automated large form factor (2' × 3') four-port differential 20 GHz vector network analyzer test system with real time link characterization

Daniel J. Schraufnagel, Bart O. McCoy, Wayne H. Fjerstad, Robert W. Techentin, Dan Johns, Barry K. Gilbert, Erik S. Daniel

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

We present the hardware, software, and operational details of a fully automated robotic flying head tester capable of measuring 4-port S-parameters on large (up to 2'×3') printed wiring boards (PWBs). The system features real-time complex compliance testing based on frequency domain analysis, time domain analysis, and/or a Fourier-transform-based technique enabling very rapid time domain link simulation of measured nets in a complete system environment. The system is equipped with a flexible, compliant-pin, differential probe design that supports frequencies up to 6 GHz. The system employs a corresponding SOLT-based calibration method that places the calibration references plane at the probe tips.

Original languageEnglish (US)
Title of host publicationIEEE AUTOTESTCON 2007
Subtitle of host publicationSystems Readiness Technology Conference, Proceedings - Transforming Maintenance: Closing the Loop Between ATE and Integrated Diagnostics
Pages80-88
Number of pages9
DOIs
StatePublished - Dec 1 2007
Event42nd Annual IEEE AUTOTESTCON Conference 2007 - Baltimore, MD, United States
Duration: Sep 17 2007Sep 20 2007

Publication series

NameAUTOTESTCON (Proceedings)

Other

Other42nd Annual IEEE AUTOTESTCON Conference 2007
CountryUnited States
CityBaltimore, MD
Period9/17/079/20/07

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ASJC Scopus subject areas

  • Computer Science Applications
  • Electrical and Electronic Engineering

Cite this

Schraufnagel, D. J., McCoy, B. O., Fjerstad, W. H., Techentin, R. W., Johns, D., Gilbert, B. K., & Daniel, E. S. (2007). Fully automated large form factor (2' × 3') four-port differential 20 GHz vector network analyzer test system with real time link characterization. In IEEE AUTOTESTCON 2007: Systems Readiness Technology Conference, Proceedings - Transforming Maintenance: Closing the Loop Between ATE and Integrated Diagnostics (pp. 80-88). [4374205] (AUTOTESTCON (Proceedings)). https://doi.org/10.1109/AUTEST.2007.4374205