Development of Conductive Boron-Doped Diamond Electrode: A microscopic, Spectroscopic, and Voltammetric Study

Kevin E. Bennet, Kendall H. Lee, James N. Kruchowski, Su Youne Chang, Michael P. Marsh, Alexander A. Van Orsow, Aurelio Paez, Felicia S. Manciu

Research output: Contribution to journalArticlepeer-review

36 Scopus citations

Abstract

Building on diamond characteristics such as hardness, chemical inertness and low electron emission threshold voltage, the current microscopic, spectroscopic and voltammetric investigations are directed towards improving the properties of electrode coating materials for their future use in clinical studies of deep brain stimulation via fast-scan cyclic voltammetry (FSCV). In this study we combine the capabilities of confocal Raman mapping in providing detailed and accurate analysis of local distributions of material constituents in a series of boron-doped polycrystalline diamond films grown by chemical vapor deposition, with information from the more conventional techniques of scanning electron microscopy (SEM) and infrared absorption spectroscopy. Although SEM images show a uniform distribution of film crystallites, they have the limitation of being unable to differentiate the distribution of boron in the diamond. Values of 1018-1021 atoms/cm3 of boron content have been estimated from the absorption coefficient of the 1290 cm-1 infrared absorption band and from the 500 cm-1 Raman vibration. The observed accumulation of boron atoms and carbon sp2 impurities at the grain boundaries suggests that very high doping levels do not necessarily contribute to improvement of the material's conductivity, corroborating with voltammetric data. FSCV results also indicate an enhanced stability of analyte detection.

Original languageEnglish (US)
Pages (from-to)5726-5741
Number of pages16
JournalMaterials
Volume6
Issue number12
DOIs
StatePublished - 2013

Keywords

  • Boron-doped diamond
  • Confocal Raman microscopy
  • Fast-scan cyclic voltammetry
  • Infrared absorption spectroscopy
  • Scanning electron microscopy

ASJC Scopus subject areas

  • Materials Science(all)

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