Determination of complex permittivity of low-loss dielectrics

Robert H. Voelker, Guang Tsai Lei, Guang Wen Pan, Barry K. Gilbert

Research output: Contribution to journalArticle

16 Scopus citations

Abstract

A new high-order-mode analytical method is described for calculating the frequency-dependent complex permittivity of a low-loss dielectric in a parallel-plate structure using a planar microwave circuit model. An analytical expression for the complex permittivity is derived in terms of the terminal impedance at a modal resonant frequency of the structure. The derivation provides physical and mathematical insight into the relation between complex permittivity and port impedance. The technique is validated by good agreement between manufacturer's specifications and complex permittivity calculated from measurements near resonant frequencies for a printed circuit board (PCB).

Original languageEnglish (US)
Pages (from-to)1955-1960
Number of pages6
JournalIEEE Transactions on Microwave Theory and Techniques
Volume45
Issue number10 PART 2
DOIs
StatePublished - Dec 1 1997

Keywords

  • Dielectric losses
  • Dielectric measurements
  • Highspeed circuits/devices
  • Microwave circuits
  • Microwave measurements
  • Microwave resonators
  • Multichip modules
  • Printed circuits

ASJC Scopus subject areas

  • Radiation
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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