Design and test methodology for an analog-to-digital converter multichip module for experimental all-digital radar receiver operating at 2 Gigasamples/s

Rick L. Thompson, Eric L.H. Amundsen, Timothy M. Schaefer, Paul J. Riemer, Michael J. Degerstrom, Barry K. Gilbert

Research output: Contribution to journalArticlepeer-review

8 Scopus citations

Abstract

In this paper, we describe the development of an analog-to-digital (A/D) converter subsystem, based on a monolithic A/D converter chip, a demultiplexer chip, and a laminate multichip module, for an experimental all-digital receiver for an airborne radar. The evolution of techniques for recording and analyzing all the data from the assembled multichip module at the full sample rate of the A/D converter, and the ways in which this test data can be used to analyze the performance of A/D converters, are described. The problems which arise in the testing of GHz A/D converters, a number of which are unique to A/D conversion at such high sample rates, are pointed out. Finally, comments on future directions in the test of high performance A/D converters are presented.

Original languageEnglish (US)
Pages (from-to)649-664
Number of pages16
JournalIEEE Transactions on Advanced Packaging
Volume22
Issue number4
DOIs
StatePublished - 1999

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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