Abstract
The design constraints encountered during the implementation of a mixed gallium arsenide/silicon ECL digital RF memory (DRFM) are described. This unit, which is configured to digitize an analog signal at 1 GHz rates, has served as a test bed for ten separate designs for the high clock rate front and back ends of the DRFM system. Preliminary test results from the GaAs components are presented and discussed.
Original language | English (US) |
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Pages | 173-176 |
Number of pages | 4 |
State | Published - 1985 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering