Bias of shear wave elasticity measurements in thin layer samples and a simple correction strategy

Jianqiang Mo, Hao Xu, Bo Qiang, Hugo Giambini, Randall Kinnick, Kai Nan An, Shigao D Chen, Zongping Luo

Research output: Contribution to journalArticle

6 Scopus citations

Abstract

Shear wave elastography (SWE) is an emerging technique for measuring biological tissue stiffness. However, the application of SWE in thin layer tissues is limited by bias due to the influence of geometry on measured shear wave speed. In this study, we investigated the bias of Young’s modulus measured by SWE in thin layer gelatin–agar phantoms, and compared the result with finite element method and Lamb wave model simulation. The result indicated that the Young’s modulus measured by SWE decreased continuously when the sample thickness decreased, and this effect was more significant for smaller thickness. We proposed a new empirical formula which can conveniently correct the bias without the need of using complicated mathematical modeling. In summary, we confirmed the nonlinear relation between thickness and Young’s modulus measured by SWE in thin layer samples, and offered a simple and practical correction strategy which is convenient for clinicians to use.

Original languageEnglish (US)
Article number1341
JournalSpringerPlus
Volume5
Issue number1
DOIs
StatePublished - Dec 1 2016

Keywords

  • Finite element method
  • Shear wave elastography
  • Thin layer
  • Ultrasound

ASJC Scopus subject areas

  • General

Fingerprint Dive into the research topics of 'Bias of shear wave elasticity measurements in thin layer samples and a simple correction strategy'. Together they form a unique fingerprint.

  • Cite this