Abstract
In this paper we obtain Bayes estimates of the parameters and reliability function of a 3-parameter Weibull distribution and compare posterior standard-deviation estimates with the corresponding asymptotic standard-deviation estimates of their maximum likelihood counterparts. Numerical examples are given.
Original language | English (US) |
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Pages (from-to) | 364-369 |
Number of pages | 6 |
Journal | IEEE Transactions on Reliability |
Volume | 37 |
Issue number | 4 |
DOIs | |
State | Published - Oct 1988 |
ASJC Scopus subject areas
- Safety, Risk, Reliability and Quality
- Electrical and Electronic Engineering