Autonomous bit error rate testing at multi-Gbit/s rates implemented in a 5AM SiGe circuit for radiation effects self test (CREST)

Paul Marshall, Marty Carts, Steve Currie, Robert Reed, Barb Randall, Karl Fritz, Krystal Kennedy, Melanie Berg, Ramkumar Krithivasan, Christina Siedleck, Ray Ladbury, Cheryl Marshall, John Cressler, Guofu Niu, Ken Label, Barry Gilbert

Research output: Contribution to journal › Article › peer-review

76 Scopus citations

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