@article{5a27f03834d34ac3b9b85c36f358f624,
title = "Autonomous bit error rate testing at multi-Gbit/s rates implemented in a 5AM SiGe circuit for radiation effects self test (CREST)",
abstract = "SEE testing at multi-Gbit/s data rates has traditionally involved elaborate high speed test equipment setups for at-speed testing. We demonstrate a generally applicable self test circuit approach implemented in IBM's 5AM SiGe process, and describe its ability to capture complex error signatures during circuit operation at data rates exceeding 5 Gbit/s. Comparisons of data acquired with FPGA control of the CREST ASIC versus conventional bit error rate test equipment validate the approach. In addition, we describe SEE characteristics of the IBM 5AM process implemented in five variations of the D flip-flop based serial register. Heavy ion SEE data acquired at angles follow the traditional RPP-based analysis approach in one case, but deviate by orders on magnitude in others, even though all circuits are implemented in the same 5AM SiGe HBT process.",
keywords = "Built in self test, High speed bit error rate testing SiGe, Single event effects (SEEs)",
author = "Paul Marshall and Marty Carts and Steve Currie and Robert Reed and Barb Randall and Karl Fritz and Krystal Kennedy and Melanie Berg and Ramkumar Krithivasan and Christina Siedleck and Ray Ladbury and Cheryl Marshall and John Cressler and Guofu Niu and Ken Label and Barry Gilbert",
note = "Funding Information: Manuscript received July 8, 2005; revised August 26, 2005. This work was supported in part by the Defense Threat Reduction Agency (DTRA), Radiation Hardened by Design Program, and the NASA Electronics Parts and Packaging Program. P. Marshall is a NASA consultant, Brookneal, VA 24528 USA (e-mail: pwmarshall@aol.com). M. Carts, M. Berg, and C. Siedleck are with Muniz Engineering, Inc., Houston, TX 77058 USA. S. Currie, B. Randall, K. Fritz, and B. Gilbert are with the Mayo Foundation, Rochester, MN 55905 USA. R. Reed is with Vanderbilt University, Nashville, TN 37235 USA. K. Kennedy, R. Ladbury, C. Marshall, and K. LaBel are with the NASA Goddard Space Flight Center, Greenbelt, MD 20771 USA. R. Krithivasan and J. Cressler are with the Georgia Institute of Technology, Atlanta, GA 30308 USA. G. Niu is with Auburn University, Auburn, AL 36849 USA. Digital Object Identifier 10.1109/TNS.2005.860740",
year = "2005",
month = dec,
doi = "10.1109/TNS.2005.860740",
language = "English (US)",
volume = "52",
pages = "2446--2454",
journal = "IEEE Transactions on Nuclear Science",
issn = "0018-9499",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "6",
}