TY - JOUR
T1 - Autonomous bit error rate testing at multi-Gbit/s rates implemented in a 5AM SiGe circuit for radiation effects self test (CREST)
AU - Marshall, Paul
AU - Carts, Marty
AU - Currie, Steve
AU - Reed, Robert
AU - Randall, Barb
AU - Fritz, Karl
AU - Kennedy, Krystal
AU - Berg, Melanie
AU - Krithivasan, Ramkumar
AU - Siedleck, Christina
AU - Ladbury, Ray
AU - Marshall, Cheryl
AU - Cressler, John
AU - Niu, Guofu
AU - Label, Ken
AU - Gilbert, Barry
PY - 2005/12/1
Y1 - 2005/12/1
N2 - SEE testing at multi-Gbit/s data rates has traditionally involved elaborate high speed test equipment setups for at-speed testing. We demonstrate a generally applicable self test circuit approach implemented in IBM's 5AM SiGe process, and describe its ability to capture complex error signatures during circuit operation at data rates exceeding 5 Gbit/s. Comparisons of data acquired with FPGA control of the CREST ASIC versus conventional bit error rate test equipment validate the approach. In addition, we describe SEE characteristics of the IBM 5AM process implemented in five variations of the D flip-flop based serial register. Heavy ion SEE data acquired at angles follow the traditional RPP-based analysis approach in one case, but deviate by orders on magnitude in others, even though all circuits are implemented in the same 5AM SiGe HBT process.
AB - SEE testing at multi-Gbit/s data rates has traditionally involved elaborate high speed test equipment setups for at-speed testing. We demonstrate a generally applicable self test circuit approach implemented in IBM's 5AM SiGe process, and describe its ability to capture complex error signatures during circuit operation at data rates exceeding 5 Gbit/s. Comparisons of data acquired with FPGA control of the CREST ASIC versus conventional bit error rate test equipment validate the approach. In addition, we describe SEE characteristics of the IBM 5AM process implemented in five variations of the D flip-flop based serial register. Heavy ion SEE data acquired at angles follow the traditional RPP-based analysis approach in one case, but deviate by orders on magnitude in others, even though all circuits are implemented in the same 5AM SiGe HBT process.
KW - Built in self test
KW - High speed bit error rate testing SiGe
KW - Single event effects (SEEs)
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U2 - 10.1109/TNS.2005.860740
DO - 10.1109/TNS.2005.860740
M3 - Article
AN - SCOPUS:33144490672
VL - 52
SP - 2446
EP - 2454
JO - IEEE Transactions on Nuclear Science
JF - IEEE Transactions on Nuclear Science
SN - 0018-9499
IS - 6
ER -