Assessment of the impact of cosmic-ray-induced neutrons on hardware in the roadrunner supercomputer

Sarah E. Michalak, Andrew J. DuBois, Curtis Storlie, Heather M. Quinn, William N. Rust, David H. DuBois, David G. Modl, Andrea Manuzzato, Sean P. Blanchard

Research output: Contribution to journalArticle

26 Scopus citations
Original languageEnglish (US)
Article number6193419
Pages (from-to)445-454
Number of pages10
JournalIEEE Transactions on Device and Materials Reliability
Volume12
Issue number2
DOIs
StatePublished - 2012
Externally publishedYes

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Keywords

  • Failures in time (FIT)
  • neutron-beam testing
  • silent data corruption (SDC)
  • single-event effect
  • soft error

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Safety, Risk, Reliability and Quality

Cite this

Michalak, S. E., DuBois, A. J., Storlie, C., Quinn, H. M., Rust, W. N., DuBois, D. H., Modl, D. G., Manuzzato, A., & Blanchard, S. P. (2012). Assessment of the impact of cosmic-ray-induced neutrons on hardware in the roadrunner supercomputer. IEEE Transactions on Device and Materials Reliability, 12(2), 445-454. [6193419]. https://doi.org/10.1109/TDMR.2012.2192736