Abstract
A procedure is proposed for the comparison of molecules. It is based on graph representations of electron density maps smoothed using three different methods: simulation of an X-ray diffraction experiment, wavelet-based multiresolution analysis, and analytical smoothing. Graph representations are obtained using a critical point analysis method. Multiple comparisons between the critical point graphs are then carried out using a simulated annealing technique. Results are compared with literature data.
Original language | English (US) |
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Title of host publication | Mathematics and Computers in Modern Science - Acoustics and Music, Biology and Chemistry, Business and Economics |
Publisher | World Scientific and Engineering Academy and Society |
Pages | 158-164 |
Number of pages | 7 |
ISBN (Print) | 9608052238 |
State | Published - Dec 1 2000 |
Keywords
- Critical Points
- Electron Density
- Molecular Similarity
- Multiresolution Analysis
- Wavelets
ASJC Scopus subject areas
- Engineering(all)