A comparative study of heavy-ion and proton-induced bit-error sensitivity and complex burst-error modes in commercially available high-speed SiGe BiCMOS

Paul Marshall, Matty Carts, Art Campbell, Ray Ladbury, Robert Reed, Cheryl Marshall, Steve Currie, Dale McMorrow, Steve Buchner, Christina Seidleck, Pam Riggs, Karl Fritz, Barb Randall, Barry Gilbert

Research output: Contribution to journal › Article › peer-review

31 Scopus citations

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