A 20 GS/s 5-Bit SiGe BiCMOS dual-nyquist flash ADC with sampling capability up to 35 GS/s featuring offset corrected exclusive-or comparators

Robert A. Kertis, Jim S. Humble, Mary A. Daun-Lindberg, Rick A. Philpott, Karl E. Fritz, Daniel J. Schwab, Jason F. Prairie, Barry K. Gilbert, Erik S. Daniel

Research output: Contribution to journalArticlepeer-review

17 Scopus citations

Abstract

The design and wafer probe test results of a 5-bit SiGe Flash ADC are presented. The integrated circuit, fabricated in a 200/250 GHz f rm T/ F, SiGe BiCMOS technology, provides a 5-bit analog to digital conversion with dual Nyquist operation at sample frequencies up to 20 GHz. Sampling clock rates are demonstrated as high as 35 GS/s. The ADC makes use of a comparator with an integrated exclusive-or function to reduce power consumption. The device also generates two half-rate interleaved outputs to ease data capture with laboratory equipment. An effective number of bits (ENOB) of nearly 5.0 is achieved for low-frequency input tones, dropping to 4.0 at 10 GHz.

Original languageEnglish (US)
Article number5226705
Pages (from-to)2295-2311
Number of pages17
JournalIEEE Journal of Solid-State Circuits
Volume44
Issue number9
DOIs
StatePublished - Sep 2009

Keywords

  • Analog-to-digital converter (ADC)
  • BVceo
  • BVcer
  • Differential nonlinearity (DNL)
  • Digital signal processor (DSP)
  • Effective number of bits (ENOB)
  • Effective resolution bandwidth (ERBW)
  • Exclusive-or
  • Fast Fourier transform (FFT)
  • Flash
  • Gray code
  • SiGe

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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