Abstract
The design and wafer probe test results of a 5-bit SiGe Flash ADC are presented. The integrated circuit, fabricated in a 200/250 GHz f rm T/ F, SiGe BiCMOS technology, provides a 5-bit analog to digital conversion with dual Nyquist operation at sample frequencies up to 20 GHz. Sampling clock rates are demonstrated as high as 35 GS/s. The ADC makes use of a comparator with an integrated exclusive-or function to reduce power consumption. The device also generates two half-rate interleaved outputs to ease data capture with laboratory equipment. An effective number of bits (ENOB) of nearly 5.0 is achieved for low-frequency input tones, dropping to 4.0 at 10 GHz.
Original language | English (US) |
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Article number | 5226705 |
Pages (from-to) | 2295-2311 |
Number of pages | 17 |
Journal | IEEE Journal of Solid-State Circuits |
Volume | 44 |
Issue number | 9 |
DOIs | |
State | Published - Sep 2009 |
Keywords
- Analog-to-digital converter (ADC)
- BVceo
- BVcer
- Differential nonlinearity (DNL)
- Digital signal processor (DSP)
- Effective number of bits (ENOB)
- Effective resolution bandwidth (ERBW)
- Exclusive-or
- Fast Fourier transform (FFT)
- Flash
- Gray code
- SiGe
ASJC Scopus subject areas
- Electrical and Electronic Engineering